The quality of tungsten needle is directly related to the detection capability of the scanning electron microscope (STM). The size, shape and chemical identity of the tungsten tip affect not only the resolution and shape of the STM image, but also the electronic state of the measurement. Therefore, the preparation of tungsten tip is particularly important. And it had better to obtain a tungsten tip with a specific radius of curvature.
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There are some traditional methods for preparing STM probes - tungsten needles. Generally, they are mechanical shearing, electrochemical etching, electron or ion beam bombardment. However, these methods cannot controllably prepare STM probes with specific tip sizes at the nanoscale. Therefore, the experts have proposed a new preparation method, that is, on the field ion microscope platform, based on electrochemical etching, using field etching technology, a nano tungsten tip with a specific radius of curvature can be prepared in real time.
